N-SIM E Super-Resolution Super-Resolution Microscope System, N-SIM E Super-Resolution, NIKON INSTRUMENTS, Системы микроскопии со сверхвысоким разрешением, (АРТ 585)
Описание
Спецификации
| Lateral resolution (FWHM of beads in xy) | 115 nm* in 3D-SIM mode |
|---|---|
| Axial resolution (FWHM of beads in z) | 269 nm* in 3D-SIM mode |
| Image acquisition time | Up to 1 sec/frame (Slice 3D-SIM) (requires additional 1-2 sec. for calculation) |
| Imaging mode | Slice 3D-SIM Stack 3D-SIM (option) |
| Multi-color imaging | 3 colors |
| Simultaneous multi-color imaging | — |
| Compatible Laser | 488 nm, 561 nm, 640 nm |
| Compatible microscope | Motorized inverted microscope ECLIPSE Ti-E
|
| Compatible objective | System can be configured with either 100x or 60x CFI SR Apochromat TIRF 100×oil (NA1.49) CFI Apochromat TIRF 100×oil (NA1.49) CFI SR Plan Apochromat IR 60×WI (NA1.27) CFI Plan Apochromat IR 60×WI (NA1.27) |
| Camera | ORCA-Flash 4.0 sCMOS camera (Hamamatsu Photonics K.K.) |
| Software | NIS-Elements Ar NIS-Elements C (for Confocal Microscope C2+) Both require additional software modules NIS-A and N-SIM Analysis |
| Operating conditions | 20 ℃ to 28 ℃ (± 0.5 ℃) |
*These values are measured using 100 nm diameter beads excited at 488 nm. Actual resolution is dependent on laser wavelength and optical configuration.
Характеристики
| N-SIM E Super-Resolution Super-Resolution Microscope System, N-SIM E Super-Resolution, NIKON INSTRUMENTS, Системы микроскопии со сверхвысоким разрешением, (АРТ 585) | |
|---|---|
| Модель: | N-SIM E Super-Resolution |
| Производитель: | NIKON INSTRUMENTS |
| Характеристики | |
| Compatible Laser | 488 nm, 561 nm, 640 nm |
| Imaging mode | Slice 3D-SIMStack 3D-SIM (option) |
| Multi-color imaging | 3 colors |
| Compatible microscope | Motorized inverted microscope ECLIPSE Ti-E Perfect Focus SystemMotorized XY stage with encodersMotorized barrier filter wheelPiezo Z stage (option) |
| Compatible objective | System can be configured with either 100x or 60x CFI SR Apochromat TIRF 100×oil (NA1.49) CFI Apochromat TIRF 100×oil (NA1.49) CFI SR Plan Apochromat IR 60×WI (NA1.27)CFI Plan Apochromat IR 60×WI (NA1.27) |
| Camera | ORCA-Flash 4.0 sCMOS camera (Hamamatsu Photonics K.K.) |
| Operating conditions | 20 ℃ to 28 ℃ (± 0.5 ℃) |
| Software | NIS-Elements Ar NIS-Elements C (for Confocal Microscope C2+)Both require additional software modules NIS-A and N-SIM Analysis |
| Lateral resolution (FWHM of beads in xy) | 115 nm* in 3D-SIM mode |
| Axial resolution (FWHM of beads in z) | 269 nm* in 3D-SIM mode |
| Image acquisition time | Up to 1 sec/frame (Slice 3D-SIM)(requires additional 1-2 sec. for calculation) |
| Simultaneous multi-color imaging | — |
Метки: N-SIM E Super-Resolution Super-Resolution Microscope System, N-SIM E Super-Resolution, NIKON INSTRUMENTS, Системы микроскопии со сверхвысоким разрешением